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GUIDEDSAMPLER: Coverage-guided Sampling of SMT Solutions.

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conference contribution
posted on 2024-02-23, 11:01 authored by Rafael Dutra, Jonathan Bachrach, Koushik Sen

 

The problem of sampling a large number of random solutions to SAT and SMT constraints is essential for constrained-random verification and testing. However, most current sampling techniques lack a problem-specific notion of coverage, considering only general goals such as uniform distribution. We have developed a new technique for coverage-guided sampling that allows the user to specify the desired coverage points in order to shape the distribution of solutions. Our tool GUIDEDSAMPLER can efficiently generate high-quality stimuli for constrained-random verification, by sampling solutions to a SMT constraint that also cover a large number of user-defined coverage classes.

History

Editor

Barrett CW ; Yang J

Journal

FMCAD

Page Range

203-211

Publisher

IEEE

BibTeX

@conference{Dutra:Bachrach:Sen:2019, title = "GUIDEDSAMPLER: Coverage-guided Sampling of SMT Solutions.", author = "Dutra, Rafael" AND "Bachrach, Jonathan" AND "Sen, Koushik", editor = "Barrett, Clark W" AND "Yang, Jin", year = 2019, month = 1, journal = "FMCAD", pages = "203--211", publisher = "IEEE" }

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