The problem of sampling a large number of random solutions to SAT and SMT constraints is essential for constrained-random verification and testing. However, most current sampling techniques lack a problem-specific notion of coverage, considering only general goals such as uniform distribution. We have developed a new technique for coverage-guided sampling that allows the user to specify the desired coverage points in order to shape the distribution of solutions. Our tool GUIDEDSAMPLER can efficiently generate high-quality stimuli for constrained-random verification, by sampling solutions to a SMT constraint that also cover a large number of user-defined coverage classes.
History
Editor
Barrett CW ; Yang J
Journal
FMCAD
Page Range
203-211
Publisher
IEEE
BibTeX
@conference{Dutra:Bachrach:Sen:2019,
title = "GUIDEDSAMPLER: Coverage-guided Sampling of SMT Solutions.",
author = "Dutra, Rafael" AND "Bachrach, Jonathan" AND "Sen, Koushik",
editor = "Barrett, Clark W" AND "Yang, Jin",
year = 2019,
month = 1,
journal = "FMCAD",
pages = "203--211",
publisher = "IEEE"
}